24-26 February 2010
Schuster
Europe/London timezone
Home > Contribution List
Displaying 46 contributions out of 46
15 Annealing studies of 3D strip detectors (C. Fleta, CNM)
3D/FBK pixel sensors measurements (A. La Rosa et al., CERN)
Beam Test Measurements with irradiated 3D-DDTC silicon strip detectors (M. Koehler, Freiburg) Invited
Session: Applications
Charactrerisation of Medipix2 edgeless pixel detectors (J. Kalliopuska, VTT)
on 26 Feb 2010 at 11:20
Session: Simulation
DISCUSSION SESSION: (chaired by H. Sadrozinski, SCIPP, Santa Cruz)
on 25 Feb 2010 at 16:10
Session: Planar sensors
DISCUSSION SESSION: (chaired by S. Watts, Manchester)
on 24 Feb 2010 at 17:15
Session: Planar sensors
Development of n-in-p silicon microstrip and pixel sensors for very high radiation environments (Y. Unno, KEK)
on 24 Feb 2010 at 16:20
Session: Planar sensors
Development of silicon strip module for very high radiation environment. (Y. Ikegami, KEK)
Session: Applications
Final remarks
on 26 Feb 2010 at 12:25
Session: Other detectors
GOSSIP (H. Van Der Graaf, NIKEF) Invited
on 26 Feb 2010 at 10:00
Session: Simulation
Geant 4 (J. Allison, G4 Associates) Invited
on 25 Feb 2010 at 14:55
Session: Planar sensors
on 24 Feb 2010 at 16:45
Session: Planar sensors
Investigation of irradiated p type silicon strip detectors by Edge-TCT (G. Kramberger et al.) Invited
on 25 Feb 2010 at 09:30
Session: Planar sensors
Investigation of the effects of thickness, pitch and manufacturer on charge multiplication properties of highly irradiated n-in-p FZ silicon strips (A. Affolder et al. Liverpool)
on 25 Feb 2010 at 11:05
Session: Introduction
Laplace-DLTS, a powerful tool for defect analysis in irradiated silicon (T. Peaker, Manchester) Invited
Session: Introduction
Laplace-DLTS, a powerful tool for defect analysis in irradiated silicon (T. Peaker, Manchester) Invited
on 24 Feb 2010 at 10:00
Session: Simulation
Simulation of charge multiplication and trap assisted tunnelling in irradiated n-in-p planar pixel detectors. (M. Benoit et al. LAL, SACLAY)
Space missions instrumentation (F. Jansen) Invited
Speed properties of 3D silicon sensors (S. Parker et al., Hawaii) invited
Session: Other detectors
Status and plans of diamond sensors (M. Mikuz, Ljubljana) In
on 26 Feb 2010 at 09:30
Session: 3D sensors
Status of 3D sensors processing at SINTEF MiNaLab (A. Kok, SINTEF
on 24 Feb 2010 at 14:50
Session: 3D sensors
Status of 3D sensors processing at STANFORD (J. Hasi, SLAC
on 24 Feb 2010 at 15:40
Session: Planar sensors
Status of the PPS R&D Project (J. Weingarten) Invited
on 25 Feb 2010 at 09:55
Session: Applications
Summary Talk (Phil Allport, Liverpool)
on 26 Feb 2010 at 11:45
Session: Planar sensors
Surface effects in irradiated silicon sensors (H. Sadrozinski, SCIPP, Santa Cruz) Invited
on 25 Feb 2010 at 10:25
Session: Planar sensors
Test beam measurements of planar n-on-p microstrip detectors (L. Wiik, Freiburg)
on 25 Feb 2010 at 11:55
Test beam results of 3D pixel sensors from different manufacturers (P. Grenier et al. on behalf of the 3DATLAS Collaboration) invited
Session: Introduction
The ATLAS IBL project (G. Darbo, INFN Genova) invited
on 24 Feb 2010 at 09:30
Session: 3D sensors
The common floor-plan of the ATLAS-IBL 3D sensors prototypes (G-F Dalla Betta,et al. On behalf of the 3Dprocessing WG)
on 24 Feb 2010 at 15:15
Session: Planar sensors
Thin planar pixel sensors and a novel interconnection technology for the upgrade of the ATLAS pixel system (A. Macchiolo et al. MPI)
on 25 Feb 2010 at 12:20
Medical Applications and Medipix (S. Pospisil, Prague)
Session: Introduction
Welcome address and practicalia
on 24 Feb 2010 at 09:15